AN 737: SEU Detection and Recovery in Intel® Arria® 10 Devices

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ID 683064
Date 10/21/2021
Public
Document Table of Contents
Document Table of Contents x
1. Overview 2. Intel® Quartus® Prime Software SEU FIT Reports 3. Intel® Arria® 10 Error Detection and Correction Feature Architecture 4. Guidelines for Error Detection CRC and Error Correction Feature 5. Guidelines for Embedded Memory ECC Feature 6. Intel® Arria® 10 EDCRC Reference Design 7. Implementing ECC Feature in Intel® Arria® 10 ROM Design 8. Modifying Single-Device .jam Files for Use in a Multi-Device JTAG Chain 9. Document Revision History for AN 737: SEU Detection and Recovery in Intel® Arria® 10 Devices
2. Intel® Quartus® Prime Software SEU FIT Reports x
2.1. Enabling the Projected SEU FIT by Component Usage Report 2.2. SEU FIT Parameters Report 2.3. Projected SEU FIT by Component Usage Report
2.3. Projected SEU FIT by Component Usage Report x
2.3.1. Component FIT Rates 2.3.2. Raw FIT 2.3.3. Utilized FIT 2.3.4. Mitigated FIT 2.3.5. Architectural Vulnerability Factor
2.3.3. Utilized FIT x
2.3.3.1. Comparing .smh Critical Bits Report to Utilized Bit Count 2.3.3.2. Considerations for Small Designs
3. Intel® Arria® 10 Error Detection and Correction Feature Architecture x
3.1. Error Detection and Correction for CRAM 3.2. Memory Blocks Error Correction Code Support
3.1. Error Detection and Correction for CRAM x
3.1.1. Error Detection Cyclic Redundancy Check 3.1.2. Recovering from CRC Errors
3.1.1. Error Detection Cyclic Redundancy Check x
3.1.1.1. Column-Based and Frame-Based Check-Bits 3.1.1.2. Error Message Register
4. Guidelines for Error Detection CRC and Error Correction Feature x
4.1. Error Detection 4.2. Enabling Error Correction (Internal Scrubbing) 4.3. Interpreting CRC_ERROR
4.1. Error Detection x
4.1.1. Enabling Error Detection 4.1.2. Reading EMR
4.1.1. Enabling Error Detection x
4.1.1.1. Enabling the Error Detection CRC_ERROR Pin
4.1.2. Reading EMR x
4.1.2.1. Reading EMR using EMR Unloader IP Core 4.1.2.2. Reading EMR using HPS 4.1.2.3. Reading EMR using JTAG Interface
4.3. Interpreting CRC_ERROR x
4.3.1. CRC_ERROR Pin Behavior 4.3.2. Correctable and Uncorrectable Error
6. Intel® Arria® 10 EDCRC Reference Design x
6.1. System Requirements 6.2. Creating Intel® Arria® 10 SEU Fault Injection and Hierarchy Tagging Design with Qsys 6.3. Design Testing with Fault Injection Debugger
6.2. Creating Intel® Arria® 10 SEU Fault Injection and Hierarchy Tagging Design with Qsys x
6.2.1. Starting Intel® Quartus® Prime Software and Opening the Reference Design Project 6.2.2. Creating New Qsys System 6.2.3. Generating Qsys System 6.2.4. Integrating Qsys System into Quartus Prime Project
6.2.2. Creating New Qsys System x
6.2.2.1. Specifying Target FPGA and Clock Settings 6.2.2.2. Adding Altera IOPLL IP Core 6.2.2.3. Adding EMR Unloader IP Core 6.2.2.4. Adding Advance SEU Detection IP Core 6.2.2.5. Adding Fault Injection IP Core 6.2.2.6. Adding Avalon-ST Splitter 6.2.2.7. Adding Serial Flash Controller
6.2.4. Integrating Qsys System into Quartus Prime Project x
6.2.4.1. Generating In-System Source and Probe IP Core 6.2.4.2. Quartus Prime Project Settings 6.2.4.3. Assigning ASD Regions 6.2.4.4. Assigning FPGA Pin Location 6.2.4.5. Compiling the Project
6.3. Design Testing with Fault Injection Debugger x
6.3.1. Converting .sof File and .smh File to .jic File 6.3.2. Programing .jic File into EPCQ-L 6.3.3. Launching Signal Tap Logic Analyzer 6.3.4. Configuring Intel® Arria® 10 and Reading .smh File with Fault Injection Debugger 6.3.5. Injecting Error with Fault Injection Debugger
7. Implementing ECC Feature in Intel® Arria® 10 ROM Design x
7.1. Examples of Error Detection and Correction
1. Overview
2. Intel® Quartus® Prime Software SEU FIT Reports
3. Intel® Arria® 10 Error Detection and Correction Feature Architecture
4. Guidelines for Error Detection CRC and Error Correction Feature
5. Guidelines for Embedded Memory ECC Feature
6. Intel® Arria® 10 EDCRC Reference Design
7. Implementing ECC Feature in Intel® Arria® 10 ROM Design
8. Modifying Single-Device .jam Files for Use in a Multi-Device JTAG Chain
9. Document Revision History for AN 737: SEU Detection and Recovery in Intel® Arria® 10 Devices

7.1. Examples of Error Detection and Correction

The following examples initiate the ROM content using the .mif file with the associated address shown in the following table.
Table 6.  Example of ROM Content Initialization
Address ROM content
00h 32h
01h 33h
02h 34h

:

:

:

:
1Dh 4Fh
1Eh 50h
1Fh 51h

Single-bit Error

The following figure shows an example of a single-bit error waveform following an SEU event impact on ROM content of address 1Fh. The waveform indicates that there is a two-clock cycle latency on the output with respect to the associated read address. When the ROM content is free from bit-flip, the eccstatus signal shows 2b’00. The ROM content of address 1Fh was initialized with data 51h using the .mif file as shown in the Example of ROM Content Initialization table. The ECC status signal shows 2b’10 indicating a single error bit is detected at the ROM content of address 1Fh. The IP corrects the error at the output.

Figure 14. Single Bit Error Waveform

Three Adjacent Bits Error

The following figure shows an example of three adjacent bits error waveform following a multi-bit upset (MBU) event on the ROM content of address 1Fh. The waveform indicates that there is a two-clock cycle latency on the output with respect to the associated read address. The ROM content of address 1Fh was initialized with data 51h using the .mif file as shown in the Example of ROM Content Initialization table. The ECC status signal shows 2b’11 which indicates 3 adjacent bits error detected at the ROM content of the address 1Fh and uncorrectable data appears at the output.

Figure 15. 3 Adjacent Bits Error Waveform
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